[IEEE-2020] Micro-Short-Circuit Cell Fault Identification Method for Lithium-Ion Battery Packs Based on Mutual Information
논문 전문 : https://ieeexplore.ieee.org/document/9062470 [출처] Y. Zheng, Y. Lu, W. Gao, X. Han, X. Feng and M. Ouyang, "Micro-Short-Circuit Cell Fault Identification Method for Lithium-Ion Battery Packs Based on Mutual Information," in IEEE Transactions on Industrial Electronics, vol. 68, no. 5, pp. 4373-4381, May 2021, doi: 10.1109/TIE.2020.2984441.https://doi.org/10.1186/s10033-018-0268-8 ※ The pic..
2021. 10. 21.
